Generating Actionable Insight While Predicting Manufacturing Operation Faults - A CIMdata Research Update

A Complimentary CIMdata Research Update with Peter Bilello, President & CEO, CIMdata

2 June 2020
14:00 EDT | 11:00 PDT

Do any of the following statements sound familiar?

Yield optimization, ramp acceleration, and test time reduction are critical, yet challenging to improve.
Reliability, performance, and quality prediction are cumbersome and lacking in accuracy.
Current R&D acceleration targets aren’t being met.
The quantity and complexity of data upon which you rely to make decisions are overwhelming.
Historical methods and conventional analytics tools are not up to the task of extracting business value.
The hypothesis-driven, iterative approaches used are time-consuming, expensive, and heavily reliant on specialized individuals.

Problem Statement

Those responsible for today’s mission-critical manufacturing operations & quality control activities in the semiconductor and high-tech industries are overwhelmed by the quantity and complexity of data upon which they rely to make product- and process-related decisions. Historical methods and conventional analytics tools struggle to extract business value due to the volume and complexity of data available in today’s digital age. These traditional hypothesis-driven, iterative approaches are typically time-consuming, expensive, and heavily reliant on specialized individuals (usually data scientists) asking the right questions of your data. As these query-based approaches generally are limited to subsets of your data, they often miss critical insights.

This webinar will share current information on research CIMdata is performing in this critical area, with a focus on the potential applicability of the emerging area of topological data analysis (TDA), which finds patterns that provide deep insights and behavior predictions within complex data sets. This approach is novel and goes beyond supervised machine learning and other established artificial intelligence techniques.

What will I learn?

You will gain insight in to CIMdata’s research with an eye on how it might help your business.
You will be able to understand the shortcomings of many of today’s analytics tools and methods.
You will gain an understanding of topological data analysis (TDA) and how it can potentially be applied to support your operations and quality data analysis needs.
You will learn more about how TDA has already been applied to a set of high-tech and semiconductor industry use cases.

Who should attend?

Manufacturing operations leads, quality control leaders, digital transformation leaders, reporting and analytics specialists, data scientists, big data initiative owners, and anyone else who wants to understand CIMdata’s research into this critical and emerging big data topic.

During the webinar you’ll also have the opportunity to ask questions about the topics discussed.