CIMdata PLM Industry Summary Online Archive

25 August 2004

Implementation Investments

Mentor Graphics FastScan ATPG Tool Selected for UMC's 130 and 90 Nanometer Reference Flow

Mentor Graphics Corporation announced that its automatic test pattern generation (ATPG) tool, FastScanT, has been selected for UMC's 130 and 90 nanometer digital reference flow. FastScan was chosen by UMC for its ability to achieve high test coverage and because it can be integrated into any standard design flow. Additionally, due to the widespread adoption of FastScan among many of the largest integrated circuit (IC) companies, UMC customers may already be familiar and have experience with the tool and its capabilities.

"We worked closely with Mentor Graphics to develop the ATPG portion of our reference flow. Using FastScan, we are able to achieve excellent test coverage which ensures we are providing our customers with high-test quality for their designs," said Ken Liou, director of the Design Support division at UMC.

The UMC digital reference flow provides a top-down solution from RTL to GDSII. The comprehensive flow targets customers designing system-on-chips (SoCs) on UMC's 130 and 90 nanometer processes. The flow is also designed to adapt to any customer design environment. Mentor's work on the ATPG portion of the flow included design-for-test (DFT) library translation and verification.

"With FastScan in use at the top IC manufacturers, it's imperative that it offers the highest performance, highest test coverage and scalability to meet changing quality and technology needs," said Robert Hum, vice president and general manager, Design Verification and Test division, Mentor Graphics. "As process technologies evolve, proven solutions are needed to address the design and test issues that arise. We work closely with our customers and foundry partners, such as UMC, to ensure FastScan is able to meet both current and future test challenges."

Mentor Graphics' FastScan is the most advanced ATPG tool available. Easily integrated into any standard design flow, the tool provides the highest test coverage while reducing test-pattern-generation time. FastScan offers a wide range of fault models and pattern types for more thorough testing, comprehensive design rules checks, and innovative algorithms for performance-oriented pattern compaction. For more information visit http://www.mentor.com/dft

 

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