CIMdata PLM Industry Summary Online Archive
5 October 2004
Company News
Test Industry Expert Joins Mentor Graphics
Mentor Graphics Corporation announced that noted test industry expert, Dr. Bernd Koenemann, has joined its Design-for-Test (DFT) product division as a chief scientist. As a member of Mentor's DFT Advanced Research Group, Dr. Koenemann will contribute to developing new test solutions that address growing design complexity and quality needs.
Dr. Koenemann joins Mentor Graphics from Cadence Design Systems. His experience includes key engineering, management and executive positions at Cadence, LogicVision, IBM and Honeywell. He holds several patents in the field of test technology. Dr. Koenemann joins an established team of test industry experts, including Dr. Janusz Rajski and Dr. Wu-Tung Cheng.
Dr. Koenemann will deliver the keynote address at the International Test Conference (ITC), October 26, in Charlotte, NC. In his speech, Test in the Era of "What You See Is NOT What You Get," Dr. Koenemann will discuss how increasing design complexities threaten design closure predictability as well as its effect on yield. It will also focus on how manufacturing test can evolve as a contributor to continuous design-process characterization. This marks the second consecutive year Mentor Graphics has presented during the ITC plenary session. Last year, Dr. Rajski delivered the invited address titled Test Challenges of Nanometer Design.
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