CIMdata PLM Industry Summary Online Archive

19 October 2004

Company News

Synopsys Showcases Galaxy 2004 Unified Design-for-Test Solution at International Test Conference

Synopsys, Inc. announced that it will showcase its complete GalaxyT 2004 unified design-for-test solution at the International Test Conference (ITC) from Tuesday, October 26 through Thursday, October 28. The Galaxy 2004 test solution delivers a comprehensive test automation solution that offers integrated circuit designers rapid test implementation, high quality manufacturing test diagnostics and working silicon with low test cost.

Synopsys also has announced that it will host its 12th annual Special Interest Group (SIG) event at ITC, a customer event where Synopsys customers speak on the industry's advancements in test and have a chance to meet and mingle with Synopsys' world-class test experts.

"The Synopsys Galaxy 2004 test automation solution offers a comprehensive family of products for mainstream to high-performance semiconductor designs. It incorporates capabilities that enable designers to achieve rapid design-for-test (DFT) closure and sign off on the testability of their mainstream chips, as well as reduce test cost and time and data volume for their most complex designs," said Antun Domic, senior vice president and general manager, Implementation Group. "ITC is an important venue to demonstrate the significance of this solution, and it allows Synopsys to reach out to product designers and test engineers responsible for IC test."

Synopsys will hold its annual SIG event at ITC, hosted by Antun Domic, senior vice president and general manager, Implementation Group, with presentations by top customers. SIG will be held on Monday, October 25 at the Levine Museum in Charlotte, North Carolina from 5:30 p.m. to 8:30 p.m. SIG offers a casual setting to meet and mingle with world-class test experts, including Thomas Williams (Synopsys and IEEE Fellow), John Waicukauski (Synopsys Fellow), Rohit Kapur (Synopsys Scientist, IEEE Fellow, and author of CTL for Test Information of Digital ICs) and Denis Martin (Synopsys Scientist). Synopsys customers may register at:   http://www.synopsys.com/cgi-bin/itc04/sigreg1.cgi

ITC will be held from Tuesday, October 26 through Thursday, October 28 at the Charlotte Convention Center in North Carolina. Synopsys will be showcasing Galaxy Test at booth #1211. Synopsys will be demonstrating its unified design and test solution for layout-driven DFT synthesis and will highlight its physical failure analysis solution for deep sub-micron test using Credence EmiScope®.

 

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