CIMdata PLM Industry Summary Online Archive

14 July 2008

Product News

Magma Enhances Knights YieldManager With New Bitmap Defect Analysis -- Improves Yield and Time to Market

Magma® Design Automation Inc. introduced significant enhancements to Knights YieldManager®, a customizable yield-management software system for semiconductor fab manufacturers worldwide. The enhancements enable fab yield, defect, test and product engineers to collect, correlate, analyze and share inline metrology, test and fab data. With improvements to the bitmap schema and bitmap loader, YieldManager users can now more accurately and effectively correlate electrical bitmap failures to inline metrology and defect data to increase yields and shorten time to market.

With the introduction of the Enhanced Bitmapping module, YieldManager now provides comprehensive defect bitmap analysis. It collects and stores a larger, richer set of bitmap data measured at different parameters from different testers. It features a powerful new GUI with many new analysis and charting features, including stacked intensity maps that stack the results of many bitmapped dies, and color codes rows and columns failures based upon frequency. These applications and additional new bitmap analysis features make it easier to identify failed bit patterns, separate nuisance and low priority defects from "killer" defects, pinpoint causes of killer defects, and thus increase yields.

"YieldManager saves engineering time and focuses resources by expediting root-cause analysis of failures and eliminating the need to maintain multiple client-server applications throughout the fab," said Ankush Oberai, vice president of Magma's Fab Analysis Business Unit. "With the new bitmap defect analysis capabilities, users can perform more accurate analysis and further improve productivity."

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