CIMdata PLM Industry Summary Online Archive
30 October 2008
Implementation Investments
Inotera Memories Expands Adoption of Magma's YieldManager, Leverages Enhanced Bitmapping Analysis to Maximize Yield of Advanced Memory Devices
Magma® Design Automation announced that Inotera Memories, a manufacturer of high-density and high-performance DRAM (Dynamic Random Access Memory) products, has adopted Magma's YieldManager® enhanced Bitmapping Analysis module. With these new capabilities, Inotera Memories can maximize yield on its most advanced memory devices to reduce manufacturing costs.
"Through successful execution of productivity improvement programs, Inotera Memories has built a reputation for providing highly cost-efficient mass production in the DRAM industry," said Uwe Lange, program manager of Inotera. "We've been using YieldManager for several years and it has proven to increase engineering productivity by expediting root-cause analysis for yield problems. In light of this success and the dedicated support we've received, we are deploying YieldManager's enhanced Bitmapping Analysis module in our fabs."
"As a high-volume manufacturer, Inotera Memories has challenging requirements," said Ankush Oberai, vice president of Magma's Fab Analysis Business Unit. "Our close collaboration with Inotera Memories has been mutually beneficial, enabling us to continually improve YieldManager and enabling them to improve productivity and yield. Inotera Memories' decision to expand the use of Magma's YieldManager software and to adopt the Bitmapping Analysis module further strengthens the relationship between the two companies."
YieldManager with Enhanced Bitmapping Analysis: Maximizing Yield, Reducing Manufacturing Costs
YieldManager enables fab yield, defect, test and product engineers to collect, correlate, analyze and share inline metrology, test and fab data. YieldManager combines high-level correlations of disparate data sources with the rapid drill-down of data scope to expedite root-cause identification of yield problems, saving engineering time and focusing resources. It eliminates the need to maintain multiple client-server applications throughout the fab, reducing the cost and complexity of the fab infrastructure by providing a single, robust and industry-proven solution.
With the addition of the enhanced Bitmapping Analysis module, YieldManager now provides comprehensive defect bitmap analysis. It collects and stores a larger, richer set of bitmap data measured at different parameters from different testers. It features a powerful new GUI with many new analysis and charting features, including stacked intensity maps that stack the results of many bitmapped dies, and color codes rows and columns of failures based on frequency. These applications and additional new bitmap analysis features make it easier to identify failed bit patterns, separate nuisance and low priority defects from "killer" defects and pinpoint causes of killer defects, maximizing yield and resources.
Become a member of the CIMdata PLM Community to receive your daily PLM news and much more.
Tell us what you think of the CIMdata Newsletter. Send your feedback.
CIMdata is committed to your privacy. Your personal information will never be sold or shared outside of CIMdata without your express permission.