CIMdata PLM Industry Summary Online Archive

6 November 2008

Product News

Teradyne and Mentor Graphics Partner to Provide Yield Learning Solution for Nanometer Geometry Devices

Teradyne, announced the successful integration of the UltraFLEX™ IG-XL™ operating system with the Mentor Graphics YieldAssist scan diagnosis product at multiple domestic and international customers. This effort implements a complete design-to-production feedback loop using the UltraFLEX test platform by providing automated diagnosis of failure data from scan-based manufacturing test. Customer-specific implementations, supported by Teradyne’s worldwide applications support team, allow users to identify and isolate yield-limiting defects.

“We are pleased to have Teradyne as a partner in the deployment of YieldAssist,” said Greg Aldrich, Director of Marketing for Design-for-Test products at Mentor Graphics. “The YieldAssist solution helps manufacturers of complex devices to quickly detect and correct design and process-related yield problems. Integrating YieldAssist with the UltraFLEX software environment provides a great deal of additional value to our mutual customers.”

“This integration demonstrates how Teradyne’s IG-XL helps unify design and test environments,” said Greg Smith, manager of Teradyne’s Broadband and Computing Business Unit. “Teradyne has been very active in driving new industry standards that will further enable collaboration of this type with our customers and third party IP providers, such as Mentor. Given our customers’ requirements for faster time-to-volume, this important new capability greatly increases their return on investment in Teradyne’s UltraFLEX platform.”

About UltraFLEX

UltraFLEX delivers the power and precision needed for testing advanced microprocessors, PC chipsets and graphics, disk drives, video game devices, System-On-a-Chip (SOC) or System-in-Package (SIP), memory, baseband digital, network, and broadband devices. UltraFLEX offers a wide range of coverage when the device mix and throughput goals demand the highest speed, precision, coverage and capacity for multisite test efficiency.

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