Synopsys, Inc.today announced a new, breakthrough ATPG and diagnostics technology that delivers 10X faster run time and 25 percent fewer test patterns to shorten schedules, accelerate silicon debug and reduce test time and cost. Innovative, memory-efficient engines for test generation, fault simulation and diagnosis execute finely segmented threads on all available server cores, maximizing throughput while minimizing the number of patterns required to achieve targeted test coverage. Combined with Synopsys' DFTMAX™ compression, this new test technology will enable design teams to meet their test quality, time and cost goals with unprecedented speed.
"Increasingly complex SoC designs and shrinking schedules require fast turn-around for generating high-quality manufacturing test patterns," said Roberto Mattiuzzo, SoC integration and DFT methodologies manager in STMicroelectronics' Digital and Mixed Processes ASIC division. "Working with Synopsys on their new ATPG technology should produce faster ATPG run times and significantly fewer test patterns to help us test first-silicon samples sooner and minimize time on the tester. This technology will also help accelerate our ramp-up of dense and complex products in FD-SOI technology thanks to an even more efficient flow for our ASIC customers."
The new test generation, fault simulation and diagnosis engines are extremely fast, exceedingly memory efficient and highly optimized for generating patterns and executing fine-grained multithreading of the ATPG and diagnosis processes. These innovations lead to fewer test patterns and 10X faster runtime, enable utilization of all server cores regardless of design size and surpass previous technologies that are limited by high memory usage. Moreover, tight links with Synopsys' GalaxyTM Design Platform tools, such as Design Compiler® RTL Synthesis, PrimeTime® timing signoff and StarRCTM parasitic extraction, along with other Synopsys tools, including Yield Explorer® yield analysis and Verdi® automated debug system, deliver the highest quality test while minimizing turnaround time.
"Customers worldwide rely on Synopsys' synthesis-based test solution to achieve the highest test quality on their most challenging designs," said Antun Domic, executive vice president and general manager for Synopsys' Design Group. "This announcement demonstrates our commitment to continually deliver innovative and groundbreaking test technologies, and addresses our customers' need for faster ATPG and diagnostics as well as reduced silicon test time."
The Synopsys synthesis-based test solution is comprised of SpyGlass® DFT ADV testability analysis, DFTMAX, DFTMAX Ultra and TetraMAX® power-aware logic test and silicon diagnostics offerings; the DesignWare® STAR Hierarchical System for hierarchical test of IP and cores on an SoC; the DesignWare STAR Memory System® solution for embedded test, repair and diagnostics; the Yield Explorer® tool for design-centric yield analysis; and the Camelot™ software system for CAD navigation. Synopsys' test solution combines Design Compiler RTL synthesis with embedded test technology to optimize timing, power, area and congestion for test as well as functional logic, leading to faster time-to-results. The Synopsys test solution delivers tight integration across the Synopsys Galaxy Design Platform, including Design Compiler, IC Compiler™ II place and route system, and PrimeTime, to enable faster turnaround time meeting both design and test goals, higher defect coverage and faster yield ramp.
